Value analysis tear-down a new process for product development and innovation Yoshihiko Sato, J Jerry Kaufman

By: Contributor(s): Material type: TextTextPublication details: New York Industrial Press 2005Description: x, : 206p. Subject(s): DDC classification:
  • 658.575 SAT 
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Item type Current library Call number Status Barcode
Book Book International Management Institute New Delhi 658.575 SAT  (Browse shelf(Opens below)) Available 14649

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Williamson Magor Library | International Management Institute New Delhi