Normal view MARC view ISBD view

Value analysis tear-down a new process for product development and innovation

Sato, Yoshihiko

Value analysis tear-down a new process for product development and innovation Yoshihiko Sato, J Jerry Kaufman - New York Industrial Press 2005 - x, : 206p.

Dewey Class. No.: 658.575 SAT

Place hold
Print
Cite
Add to your cart (remove)
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS ISBD
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)